X-ray for Structure Analysis
Methods IOC, Breit/Brückner/Plattner
| X-ray for Structure Analysis | Model: | Nonius Kappa CCD diffractometer (build 1998) |
| Unit and Room: | Org. Chem., R -102 | |
| Responsible: | Dr. Manfred Keller | |
| X-ray diffraction | Further information: | |
| Short Description: 4-Circle X-ray diffractometer with CCD detector | Picture of the Equipment
| |
| Available Experiments/Techniques: Unit cell determination, intensity measurement (down to 110 K) | ||
Special Equipment: | ||
| Measurements on the equipment are currently done by: | Trained scientific service personal
| |
| Recent Publications, where this instrument was important (citation): |
| |
| Typical problems that may be solved with this instrument: | Determination of molecular structures | |
X-ray for Structure Analysis (this page as pdf file)