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Environmental Scanning Electron Microscope II

Methods IMC, Mühlhaupt

Environmental Scanning Electron Microscope II (SEM/ESEM) Model: Quanta 250 FEG (FEI)
Unit and Room: ZfN, Albertstraße 23,back building, basement, room nr. 9
Responsible: Dr. Yi Thomann, Dr. Ralf Thomann
Electron Microscopy
Further information: http://www.fmf.uni-freiburg.de/service/ dienstleistungen/mikroskopie/index_htm

Short Description:

SEM/ESEM machine with field emission gun and analytical EDX system

Picture of the Equipment

Environmental Scanning Electron Microscope II (SEM/ESEM)
 

Available Experiments/Techniques:

SEM measurements under high- and low-vacuum conditions, and resolutions down to about 1.5nm. The machine allows a watery gaseous environment in the specimen chamber up to pressures of 4000 Pa, for the observation of biological or medical samples in their natural state.
The microscope is equipped with an Oxford EDX system for elemental analysis.

Special Equipment:

Sample preparation equipment

Measurements on the equipment are currently done by: Students after extensive training
Trained scientific service personal
 
Recent Publications, where this instrument was
important (citation):
Polyethylene/synthetic boehmite alumina nanocomposites:
eXPRESS Polymer Letters Vol.4, No.x (2010) x–x, in print
 
Typical problems that may be solved with this instrument: Morphological characterization
Elemental analysis

 

pdficon.gif Environmental Scanning Electron Microscope II (this page as a pdf file)

 

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