Multimode Atomic Force Microscope
Methods IMC, Mühlhaupt
| Multimode Atomic Force Microscope | Model: | Veeco DI Nanoscope 3 |
| Unit and Room: | FMF, 1.UG,-01 006 | |
| Responsible: | Dr. Yi Thomann |
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| AFM, two identical microscopes |
Further information: | http://www.fmf.uni-freiburg.de/service/ dienstleistungen/mikroskopie/index_htm/ |
| Short Description: Atomic Force Microscope with various imaging modes |
Picture of the Equipment
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| Available Experiments/Techniques: The multimode AFM allows the morphological and mechanical characterization of small samples with several imaging modes: |
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| Special Equipment: Sample preparation equipment |
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| Measurements on the equipment are currently done by: | Students after extensive training Trained scientific service personal |
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| Recent Publications, where this instrument was important (citation): |
Macromolecules 2009, 42(15), 5684-5699 Langmuir (2007), 23(21), 10746-10755. |
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| Typical problems that may be solved with this instrument: | The microscope allows the characterization of surfaces of nearly every material, and the investigation of bulk morphologies on microtomed samples.Topography and material properties can be imaged. |
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Multimode Atomic Force Microscope (this page as a pdf file)