Atomic Force Microscope
Methods IMC, Mühlhaupt
| Atomic Force Microscope | Model: | PicoSPM II |
| Unit and Room: | ZfN, Albertstraße 23,back building, basement, room nr. 8 | |
| Responsible: | Dr. Yi Thomann, Dr. Ralf Thomann |
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| AFM, (with MacMode) |
Further information: | http://www.fmf.uni-freiburg.de/service/ dienstleistungen/mikroskopie/index_htm/ |
| Short Description: Atomic Force Microscope with various imaging modes |
Picture of the Equipment
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| Available Experiments/Techniques: The AFM allows the morphological and mechanical characterization of small samples with several imaging modes: |
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| Special Equipment: Sample preparation equipment |
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| Measurements on the equipment are currently done by: | Students after extensive training Trained scientific service personal |
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| Recent Publications, where this instrument was important (citation): |
Polymer (2006), 47(11), 3740-3746. Chinese J. Polym. Sci. 25, 83 (2007) |
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| Typical problems that may be solved with this instrument: | The microscope allows the characterization of surfaces of nearly every material, and the investigation of bulk morphologies on microtomed samples.Topography and material properties can be imaged |
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Atomic Force Microscope (this page as a pdf file)