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Photomodulated Reflection Spectroscopy

PR Spectroscopy

Methods FMF, Fiederle

Photomodulated Reflection Spectroscopy Model: FMF model
Unit and Room: FMF, 1rd floor, R. 01027
Responsible: Dr. M. Fiederle
Spectrosccopy
Further information: www.fmf.uni-freiburg.de/service/
servicegruppen/sg_matchar/chat/

Short Description:

Measurement of semiconductor band structure and measurement of surface reflection and material transmission.

Picture of the Equipment


 

Available Experiments/Techniques:

Excitation with LASER or LED in combination with white light reflection. Phase locked signal detection. 

Special Equipment:

Lock-In Amplifier SR830
0.85m double monochromator SPEX 1404
Low temperature unit (77K - 300K)
Optics, gratings, bandpass filters
Si photodiode, liquid nitrogen cooled Ge photodiode
Ar-ion laser
Thermal white light sources

Measurements on the equipment are currently done by: Students after extensive training
Trained scientific service personal
 
Recent Publications, where this instrument was
important (citation):
J. Appl. Phys. 103, 073103 (2008); doi:10.1063/1.2895002
Typical problems that may be solved with this instrument: - Investigations on semiconductor band structure
- Reflection / Transmission analysis

 

pdficon.gif Photomodulated Reflection Spectroscopy (this page as a pdf file)

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